Course record MSE
MSE 4766
Fabrication and Properties of Nanoscale Devices
Georgia Institute of Technology-Main Campus
12 sections3 professors
Grades: 2013–2025Evaluations: 2013–2023
Flunk Score35/100
Below average
Student evaluations
4.04 / 5
School avg. 4.36
9 reported responses
How the ratings compare
Compared with the school, highest difference first.
Assignment measured knowledge+0.25
Amount learned−0.04
Instructor availability−0.06
Course effectiveness−0.17
Instructor respectfulness−0.19
Instructor clarity−0.27
Instructor effectiveness−0.31
Instructor stimulates interest−0.36
Instructor helpfulness−0.40
Instructor enthusiasm−0.45
Instructor communication−0.55
Left: below school averageRight: above school average
0 = school average for each question. +0.50 means half a point above it on the 1–5 rating scale.
View exact values
GT CIOS (11-item) · across 3 rated professors · A signal, not a grade
| Question | Record | School | Difference |
|---|---|---|---|
| Amount learned | 4.12 | 4.16 | −0.04 |
| Instructor clarity | 3.97 | 4.24 | −0.27 |
| Course effectiveness | 4.09 | 4.26 | −0.17 |
| Instructor enthusiasm | 4.09 | 4.54 | −0.45 |
| Instructor helpfulness | 3.74 | 4.14 | −0.40 |
| Instructor availability | 4.39 | 4.46 | −0.06 |
| Instructor communication | 3.84 | 4.39 | −0.55 |
| Instructor effectiveness | 4.08 | 4.39 | −0.31 |
| Instructor respectfulness | 4.38 | 4.57 | −0.19 |
| Assignment measured knowledge | 4.33 | 4.08 | +0.25 |
| Instructor stimulates interest | 3.80 | 4.16 | −0.36 |
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