Course record MSE
MSE 4766
Fabrication and Properties of Nanoscale Devices
Georgia Institute of Technology-Main Campus
12 sections3 professors
Grades: 2013–2025Evaluations: 2013–2023
Flunk Score35/100
Below average
Peter Hesketh 11 sections · 11 terms · 2013–2025 3.56GPA
Published grade shares · 11 sections · 2013–2025
Compare with the course
Hesketh vs. the course average
A
−4.0
B
+4.0
C
same
D
same
F
same
Difference in percentage points.
Each term against the course average
Fall 2013Fall 2025
Overall4.20 / 5
2 reported responses
Scale 1–5
Amount learned4.18
Instructor clarity3.97
Course effectiveness4.13
Instructor enthusiasm4.22
Instructor helpfulness3.92
Instructor availability4.52
Instructor communication4.13
Instructor effectiveness4.22
Instructor respectfulness4.75
Assignment measured knowledge4.00
Instructor stimulates interest3.92
Woonhong Yeo 1 sections · 1 term · 2018 · Limited sample 4.00GPA
Published grade shares · 1 section · 2018 · Limited sample
Overall4.38 / 5
1 reported responses
Scale 1–5
Amount learned4.00
Instructor clarity5.00
Course effectiveness4.00
Instructor enthusiasm5.00
Instructor helpfulness3.00
Instructor availability5.00
Instructor communication5.00
Instructor effectiveness4.00
Instructor respectfulness5.00
Assignment measured knowledge5.00
Instructor stimulates interest3.00
Zhitao Kang 6 reported responses 3.92Eval / 5
Overall3.92 / 5
6 reported responses
Scale 1–5
Instructor clarity3.80
Instructor enthusiasm3.90
Instructor helpfulness3.80
Instructor availability4.25
Instructor communication3.55
Instructor effectiveness4.05
Instructor respectfulness4.15
Instructor stimulates interest3.90
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