Professor record ME

Peter Hesketh

Georgia Institute of Technology-Main Campus

11 sections
Grades: 2013–2025Evaluations: 2013–2023
Flunk Score—
Not enough comparison data

A reliable within-course grade or school-relative evaluation comparison is needed to score MSE 4766.

MSE 4766 · Fabrication and Properties of Nanoscale DevicesMSE 4766 · all instructors & syllabi

Student evaluations

4.20 / 5 School avg. 4.36

2 reported responses

How the ratings compare

Compared with the school, highest difference first.

Instructor respectfulness+0.18
Instructor availability+0.06
Amount learned+0.02
Assignment measured knowledge−0.08
Course effectiveness−0.13
Instructor effectiveness−0.17
Instructor helpfulness−0.22
Instructor stimulates interest−0.24
Instructor communication−0.26
Instructor clarity−0.27
Instructor enthusiasm−0.32
Left: below school averageRight: above school average

0 = school average for each question. +0.50 means half a point above it on the 1–5 rating scale.

View exact values

GT CIOS (11-item) · in MSE 4766 · A signal, not a grade

Means on a 1–5 scale. Response totals above describe the combined record, not each question.
QuestionRecordSchoolDifference
Amount learned4.184.16+0.02
Instructor clarity3.974.24−0.27
Course effectiveness4.134.26−0.13
Instructor enthusiasm4.224.54−0.32
Instructor helpfulness3.924.14−0.22
Instructor availability4.524.46+0.06
Instructor communication4.134.39−0.26
Instructor effectiveness4.224.39−0.17
Instructor respectfulness4.754.57+0.18
Assignment measured knowledge4.004.08−0.08
Instructor stimulates interest3.924.16−0.24
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