Professor record ME
Peter Hesketh
Georgia Institute of Technology-Main Campus
Grade distribution unavailable
Evaluations: 2013–2023
Flunk Score—
Not enough comparison dataA reliable within-course grade or school-relative evaluation comparison is needed to score ME 4766.
ME 4766 · Fabrication and Properties of Nanoscale DevicesME 4766 · all instructors & syllabi
Student evaluations
4.30 / 5
School avg. 4.36
4 reported responses
How the ratings compare
Compared with the school, highest difference first.
Amount learned+0.27
Instructor respectfulness+0.20
Instructor enthusiasm+0.10
Instructor availability+0.07
Instructor stimulates interest−0.00
Instructor effectiveness−0.03
Instructor helpfulness−0.07
Course effectiveness−0.08
Instructor clarity−0.17
Assignment measured knowledge−0.18
Instructor communication−0.56
Left: below school averageRight: above school average
0 = school average for each question. +0.50 means half a point above it on the 1–5 rating scale.
View exact values
GT CIOS (11-item) · in ME 4766 · A signal, not a grade
| Question | Record | School | Difference |
|---|---|---|---|
| Amount learned | 4.43 | 4.16 | +0.27 |
| Instructor clarity | 4.07 | 4.24 | −0.17 |
| Course effectiveness | 4.19 | 4.26 | −0.08 |
| Instructor enthusiasm | 4.64 | 4.54 | +0.10 |
| Instructor helpfulness | 4.07 | 4.14 | −0.07 |
| Instructor availability | 4.53 | 4.46 | +0.07 |
| Instructor communication | 3.83 | 4.39 | −0.56 |
| Instructor effectiveness | 4.36 | 4.39 | −0.03 |
| Instructor respectfulness | 4.77 | 4.57 | +0.20 |
| Assignment measured knowledge | 3.90 | 4.08 | −0.18 |
| Instructor stimulates interest | 4.16 | 4.16 | −0.00 |
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