Course record ME
ME 4766
Fabrication and Properties of Nanoscale Devices
Georgia Institute of Technology-Main Campus
Grade distribution unavailable3 professors
Evaluations: 2013–2023
Flunk Score—
Not enough comparison dataThis course does not have a reliable within-school grade or evaluation comparison yet.
Student evaluations
4.36 / 5
School avg. 4.36
12 reported responses
How the ratings compare
Compared with the school, highest difference first.
Instructor respectfulness+0.22
Instructor enthusiasm+0.21
Amount learned+0.15
Course effectiveness+0.08
Instructor availability+0.05
Instructor helpfulness+0.05
Instructor clarity+0.05
Instructor effectiveness−0.00
Instructor stimulates interest−0.11
Assignment measured knowledge−0.13
Instructor communication−0.45
Left: below school averageRight: above school average
0 = school average for each question. +0.50 means half a point above it on the 1–5 rating scale.
View exact values
GT CIOS (11-item) · across 3 rated professors · A signal, not a grade
| Question | Record | School | Difference |
|---|---|---|---|
| Instructor clarity | 4.29 | 4.24 | +0.05 |
| Instructor enthusiasm | 4.75 | 4.54 | +0.21 |
| Instructor helpfulness | 4.19 | 4.14 | +0.05 |
| Instructor availability | 4.51 | 4.46 | +0.05 |
| Instructor communication | 3.94 | 4.39 | −0.45 |
| Instructor effectiveness | 4.39 | 4.39 | −0.00 |
| Instructor respectfulness | 4.79 | 4.57 | +0.22 |
| Instructor stimulates interest | 4.05 | 4.16 | −0.11 |
| Amount learned | 4.31 | 4.16 | +0.15 |
| Course effectiveness | 4.34 | 4.26 | +0.08 |
| Assignment measured knowledge | 3.95 | 4.08 | −0.13 |
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